IEEE standard for terminology and test methods for analog-to-digital converters

Cover of: IEEE standard for terminology and test methods for analog-to-digital converters |

Published by Institute of Electrical and Electronics Engineers in New York .

Written in English

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Subjects:

  • Analog-to-digital converters -- Standards,
  • Analog-to-digital converters -- Testing -- Standards

About the Edition

IEEE Std 1241-2001 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufactures and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.

Edition Notes

Book details

Other titlesStandard for terminology and test methods for analog-to-digital converters., IEEE Std 1241-2001.
Statementsponsor, Waveform Measurement and Analysis Technical Committee (TC-10) of the IEEE Instrumentation and Measurement Society.
SeriesIEEE Std -- 1241-2001., IEEE std -- 1241-2001.
ContributionsIEEE Instrumentation and Measurement Society. Waveform Measurement and Analysis Technical Committee., Institute of Electrical and Electronics Engineers., IEEE Standards Board., IEEE Standards Association.
The Physical Object
Paginationv, 92 p. :
Number of Pages92
ID Numbers
Open LibraryOL17605742M
ISBN 100738127248, 0738127256
OCLC/WorldCa50141272

Download IEEE standard for terminology and test methods for analog-to-digital converters

Abstract: The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled.

This standard also presents terminology and definitions to aid the user in defining and testing ADCs. - IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters IEEE. The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs).

This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled.

In general, this quantization is assumed to be nominally uniform (the input-output. IEEE Xplore, delivering full text access to the world's highest quality technical literature in engineering and technology.

| IEEE Xplore - IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters - IEEE Standard. Scope: Analog to Digital converters, with or without sample and hold circuitry. Sep Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting.

The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. Published Standards: IEEE Std – IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters Status: Active – Approved Approved by the IEEE Standards Association on 17 Junepublished on 14 Januaryand is available from IEEE Xplore Digital Library Active Projects: P (Revision to IEEE Std ) Title: Standard for Terminology and Test Methods.

IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices Abstract: Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing.

P (Revision to IEEE Std ) Title: Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices Scope: This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs).

It is restricted to monolithic, hybrid, and module. The Sponsor scope shall cover the IMS field of interest, which is the science, technology, and application of instrumentation and measurement. TC is actively developing three standards: P (Revision) Standard for Terminology and Test Methods for Analog-to-Digital Converters P (Revision) Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices P (New.

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters IEEE Std. IEEE Standard for a Smart Transducer Interface for Sensors and Actuators-Transducer to. Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided.

It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs. IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices. IEEE has many similarities to IEEE Standard for Terminology and Test Methods for Analog to Digital Converters (ADCs).

However, IEEE Std. shall be used for waveform recorders and IEEE Std. shall be used for ADCs. IEEE Standard for Digitizing Waveform Recorders: IM/WM&A - TC IEEE Standards for Terminology and Test Methods for Analog-to-Digital Converters: IM/ST - TC9: IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) Formats.

ieee Title: Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices Working Group Chair: Nicholas Paulter, [email protected]   IEEE has many similarities to IEEE Standard for Terminology and Test Methods for Analog to Digital Converters (ADCs).

However, IEEE Std. shall be used for waveform recorders and IEEE Std. shall be used for ADCs. The confidence level values used in the NRECORD calculation originate from Table 2 of the IEEE Standard Draft, printed on May 12th, - Standards for Terminology and Test Methods for Analog-to-Digital Converters Prepared by the Analog-to-Digital Converter Subcommittee of the Waveform Measurements and Analysis Committee of the IEEE.

Published Standards: IEEE Std – IEEE Standard for Terminology and Test Methods for Circuit Probes Status: Active – Approved Approved the IEEE Standards Association in and is available for purchase from IEEE Xplore Digital Library Working Group Site.

DOI: /ieeestd Corpus ID: IEEE standard for terminology and test methods for analog-to-digital converters @inproceedings{DaponteIEEESF, title={IEEE standard for terminology and test methods for analog-to-digital converters. The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs).

This standard considers only those ADCs whose output values have discrete values at. Get this from a library.

IEEE standard for terminology and test methods of digital-to-analog converter devices. [Institute of Electrical and Electronics Engineers.; IEEE-SA Standards Board.;] -- Abstract: Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided.

IEEE standard for terminology and test methods for analog-to-digital converters. [Institute of Electrical and Electronics Engineers.; IEEE-SA Standards Board.;] -- Abstract: The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs).

the nature of linearity errors and how to test for them, the end-point errors must first be established. There are many methods to measure the static errors of a DAC—the proper choice depends upon the specific objectives of the testing.

For instance, an IC manufacturer generally performs production testing on DACs using specialized automatic test. Get this from a library. IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters. IEEE - Terminology and Test Methods for Analog-to-Digital Converters Published by IEEE on J The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs).

Test Methods for Analog-to-Digital Converters 1. Overview Std IEEE STANDARD FOR TERMINOLOGY AND TEST METHODS. Guidance to the user Interfacing ADCs present unique interfacing challenges, and without careful attention users can experience.

This yardstick is the IEEE StandardTerminology and Test Methods for Analog-to-Digital Converters. The older standard is also acceptable. When image sensor designers ignore this important standard, they run the risk of comparing their ADC to other ADCs using the wrong reference parameters.

View Notes - IEEE Standars for Terminology and Test methods for Analog to DIgital Converters from ELEC diseno at Universidad Tecnológica de Panamá. IEEE Std IEEE Standard for Terminology. IEEE Std IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters.

The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs).

This paper is intended to provide an introduction to IEEE-STD [IEEEIEEE draft standard for terminology and test methods for analog-to-digital converters], a draft standard for analog-to-digital converters (ADCs). This standard has been generated by the IEEE TC working group and is intended to establish common terms, definitions.

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters-Abstract: IEEE Std identifies analog-to-digital converter (AD. IEEE Std. () IEEE Standard for terminology an test methods for analog-to-digital converters Google Scholar IEEE Std. () IEEE Std on transitions, pulses, and related waveforms Google Scholar.

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). Get this from a library. - IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters.

IEEE IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices Paperback – Febru by IEEE (Author) See all formats and editions Hide other formats and editions. Price New from Author: IEEE. IEEE Std“Standard for Terminology and Test Methods for Analog-to-Digital Converters” [7] The IEEE Std provides common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs).

It considers only those ADCs whose output values have discrete values at discrete. formed to develop the IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters.

This standard was completed and released in December as IEEE Std [3]. Several standards have previously been written that address the testing of analog-to-digital converters either directly or indirectly.

These include. Signal-to-noise and distortion ratio (SINAD) is a measure of the quality of a signal from a communications device, often defined as = + + +, where is the average power of the signal, noise and distortion components.

SINAD is usually expressed in dB and is quoted alongside the receiver RF sensitivity, to give a quantitative evaluation of the receiver sensitivity. IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters Attendance: (Some arrived at different times during the day) Steve Tilden Texas Instruments, Tucson, AZ USA [email protected] (Chairman) Bob Graham Sandia National Labs, Albuquerque, NM USA [email protected] (Editor).

In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs. The goal is to update the standard to make it consistent with the analog to digital converter standard and to make it more user frien dly.

IEEE - Standard for Terminology and Test Methods for Analog-to-Digital Converters This working group completed IEEE standard in late The group is currently working towards incorporating much.

-to-Digital Converter Survey of Analysis::R H Walden::IEEE - Apr. - 99, Jl. On selected areas in comm. t techniques for achieving high speed - high resolution A/D convM P TIMKO::JSSC Dec.

- ' 80 ew of IEEE-STD “standard for terminology and test methods for analog-to-digital converters”.IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters Attendance: (Some arrived at different times during the day) Robert Graham Sandia National Laboratories, Albuquerque, NM USA (Editor) [email protected] Sol Max LTX Corporation, Norwood, MA USA (Secretary) [email protected] sequences are obtained by genetic algorithms, either independently of a physical implementation of the analog- to-digital converter, or by optimizing the parameters of an oversampled conversion Low-cost test of embedded RF/analog/mixed-signal circuits in SOPs.

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